HORIBA STEC japan Worldwide
News & EventsCompanyProcurement HomeContactsSite MapJapaneseUSEurope
Products & Support Mass Flow Controller Liquid Flow and Vaporizer Vacuum and Gas Monitor Pressure Controller Semiconductor Process Product List

 Home > Products & Support > Semiconductor Process

To top page of Semiconductor Process To top page of Products for Semiconductor/FPD Industry
List by Production Process

Front-end Process
Front-end Process
Material Analysis (Particulates Analysis & Defect Analysis)
·
Energy Dispersive X-ray Analyzer
 
EMAX ENERGY
·
X-ray Microscope
 
XGT-5000
 
·
Glow Discharge Optical Emission Spectroscopy
 
GD-Profiler 2
 
·
Raman Spectrophotometer
 
             

DI Water Analysis (Wet Process)
·
In-line Particle Sensor(Ultra-pure Watar)
 
PLCA-800
·
Dissolved Oxygen Monitor
 
SD-300
 
·
Silica Monitor
 
SLIA-300
 
·
2-Channel Resistivity Meter
 
HE-960RW
 
 
·
Silica Analyzer
 
SLIA-2000
       
         
Pure Water Instrumentation icon
 

Chemical Analysis (Wet Process)
·
SC-1 Monitor
 
CS-131
·
HF/HCL/NH3 Concentration Monitor
 
HF-960M
 
·
SC-2 Monitor
 
CS-152
 
·
Dissolved Ozone Monitor
 
HZ-960
 
 
·
FPM Monitor
 
CS-153
 
·
Resistivity Meter
 
HE-480R
 
 
·
BHF Monitor
 
CS-137
 
·
2-Channel Carbon Sensor Resistivity Meter
 
HE-960RW-GC
 
 
·
HF/HNO3Monitor
 
CS-153N
 
·
Carbon Sensor Resistivity Meter
 
HE-960R-GC
 
 
·
Fiber Optic Type Chemical Solution Concentration Monitor
 
CS-100F1 Series
 
·
Conductivity Meter (Low Density Type)
 
HE-480C
 
 
·
TMAH/H2O2 Monitor
 
CS-139E
 
·
Conductivity Meter (High Density Type)
 
HE-480H
 
 
·
SPM Monitor
 
CS-150
 
·
TMAH Conductivity Meter
 
HE-960TM
 
 
·
Hydrofluoric Acid Monitor
 
CM-200/210
 
·
Liquid Mass Flow Meter/Controller
 
LF-F/LV-F Series
 
 
·
In-line Particle Sensor (Chemicals/Resist)
 
PLCA-800
       
         
Instrumentation for Solutions used in the Process icon
 

Gas Control/Analysis (Dry Process)
·
FTIR Gas Analyzer
 
FG-100A Series
·
Digital Mass Flow Controller
 
SEC-Z500X Series
 
·
In-line Gas Monitor
 
IR-150S/150L
 
·
Vaporized Liquid Source Control System
 
LSC-A100 Series
 
 
·
Automatic Pressure Regulator
 
UR-7340/7350 Series
 
·
Liquid Auto Refill System
 
LU-A1000 series
 
 
·
Liquid InjectionSystem
 
MI/MV / VC Series
 
·
Mass Flow Controller
 
SEC-4001 / 8000 Series
 
         
Gas Monitoring Instrumentation icon
 

Process Monitoring (Dry Process)
·
Residual Gas Analyzer
 
MICROPOLE™ System
     
             

Thin Film Control/Analysis
·
Plasma Diagnosis Endpoint Monitor
 
PLASMASCOPE
·
Full Automatic Spectroscopic Ellipsometer
 
UT-300
 
·
Plasma Diagnosis Endpoint Monitor
 
DIGICPMJ
 
·
Full Automatic Raman Analyzer
 
FR-3000
 
 
·
Real Time Interferometric Film Thickness Monitor
 
LEM-CT670
 
·
Visible Spectroscopic Ellipsometer
 
MM-16
 
 
·
Real Time Interferometric Film Thickness Monitor
 
DIGILEM-CPM
 
·
Single-wavelength Ellipsometer
 
PZ2000
 
 
·
Spectroscopic Ellipsometer
 
UVISEL
       
             

Drain Water Analysis
·
Fluoride Ion Monitor
 
FLIA-101
·
Free Fluoride Ion Monitor
 
IF-250
 
·
Total Nitrogen/Total Phosphorus Measurement System
 
TPNA-300
       
             

CMP Process
·
Laser Scattering Particle Size Distribution Analyzer
 
LA-950
·
Dynamic Light Scattering Particle Size Distribution Analyzer
 
LB-550
             


TOP
Copyright (C) 2008 HORIBA STEC, Co.,Ltd. All rights reserved.

Copyright © 2008 HORIBA STEC, Co.,Ltd. All rights reserved. The information shown on this document may be modified without notice. Refer to the original web page for update. The page was copied from:
 
Explore the future HORIBA STEC