HORIBA STEC japan Worldwide
News & EventsCompanyProcurement HomeContactsSite MapJapaneseUSEurope
Products & Support Mass Flow Controller Liquid Flow and Vaporizer Vacuum and Gas Monitor Pressure Controller Semiconductor Process Product List

 Home > Products & Support > FPD Process

To top page of FPD Process To top page of Products for Semiconductor/FPD Industry
List by Production Process

Array Process
Array Process
Array Process
Drain Water Analysis
·  Free Fluoride Ion Monitor
 
IF-250
·  Total Nitrogen/Total Phosphorus Measurement System
TPNA-300
 
·  Fluoride Ion Monitor
 
FLIA-101
     
         

Thin Film Analysis
·  Full Automatic Film Analyzer
 
FF-1000 Series
·  Visible Spectroscopic Ellipsometer
MM-16
 
·  Spectroscopic Ellipsometer
 
UVISEL Series
     
         

Lithography Process
·  FPD Mask Particle Detection System
PR-PD4
·  Reticle/Mask Particle Detection System
 
PR-PD3
         

Dry Process
Gas Analysis
 
·  In-line Gas Monitor
 
IR-150S/150L
·  FTIR Gas Analyzer
 
FG-100A Series
 
 
Gas Control
 
 
·  Mass Flow Controller
 
SEC-Z500 Series
 
·  Mixed Injection System
 
MI/MV Series
 
 
·  Automatic Pressure Regulator
 
UR-7300 Series
 
·  Liquid Auto Refill System
 
LU-A1000 series
 
 
·  Digital Liquid Mass Flow Meter/Controller
 
LF-F/LV-F Series
     
 
Vacuum Measurement
 
 
·  Residual Gas Analyzer
 
MICROPOLE™ System
     
 
Thin Film Control/Analysis
 
 
·  Plasma Diagnosis Endpoint Monitor
CPM100
     
         

Wet Process
·  HNO3/CH3COOH/H3PO4 Monitor
(for AI Etching)
CS-139J
·  Conductivity Meter
(High Concentration Type)
 
HE-480H
 
·  BHF Monitor
 
CS-137
 
·  TMAH Conductivity Meter
 
HE-960TM
 
 
·  Hydrofluoric Acid Monitor
 
CM-200/210
 
·  In-line Particle Sensor (Ultra-pure Water)
 
PLCA-800
 
 
·  Conductivity Meter
(Low Concentration Type)
 
HE-480C
     
         

DI Water Analysis (Wet Process)
·  In-line Particle Sensor (Ultra-pure Water)
 
PLCA-800
·  Dissolved Oxygen Monitor
 
SD-300
 
·  Silica Monitor
 
SLIA-300
 
·  Resistivity Meter
HE-960RW
 
 
·  Silica Analyzer
 
SLIA-2000
     
         

Process Monitoring (Dry Process)
·  Residual Gas Analyzer
 
MICROPOLE™ System
   
         


TOP
Copyright (C) 2008 HORIBA STEC, Co.,Ltd. All rights reserved.

Copyright © 2008 HORIBA STEC, Co.,Ltd. All rights reserved. The information shown on this document may be modified without notice. Refer to the original web page for update. The page was copied from:
 
Explore the future HORIBA STEC